Page 34 - libroBrevetti

Department of Engineering, ICT and Technologies for Energy and Transport Patent Title Procedure and system for the three-dimensional reconstrucƟŽn of ĨŽƌŵĂƟŽŶs dispersed in a matrix material, in parƟĐƵůĂr inclusions in crystalline matrices. Ref. CNR 10177 Assignee(s): CNR CNR InsƟƚute: IMEM Main Inventor: Andrea ĂƉƉĞƫni Countries: IT, EP Priority date: 05/09/2012 Abstract The presence of inclusions in the ŵĂƚƌŝdž ĚdĞͬ ĚŶdĞ ŝƐ ĂŶ ŝŵƉŽƌƚĂŶƚ ĂƐƉĞĐƚ ŽĨ ƚŚĞ ĐŚĂƌĂĐƚĞƌŝnjĂƟŽŶ͕ because these are detrimental to X-ray detector appůŝĐĂƟŽns. The standard methods for the deteĐƟŽn of inclusions do not allow a 3D reconstruĐƟŽn of the posŝƟŽn of the inclusions in the crystalline matrix. For this reason, a technique was developed for the analysis of images collected by an opƟcal microscope which allows to ŝĚĞŶƟĨy the inclusions, to count the inclusion number in the whole volume of the sample, to determine the inclusion size and to determine the inclusion distribuƟŽŶ in 3D. This technique can be implemented on any exisƟŶŐ ŽƉƟĐĂů microscope, using standard personal computers for data processing and edžƉůŽŝƟŶŐ open source sŽŌware. The technique can also be used for surface reconstruĐƟŽn imaging and surface roughness measurements. Background Nowadays the commercial microscopy systems allow counƟŶŐ inclusions in a transparent matrix using the technique so called "extended focus". However, this technique does not allow to determine the in depth posŝƟŽn of the inclusions and therefore gives no informaƟon on their actual disƚƌŝďƵƟon in 3D. In addŝƟŽn, the count is underesƟmated, because in the case of stacked inclusions, only the Įrst one is counted. Technology The reconstrucƟon system was developed on a standard ŽƉƟcal microscope in transmission and was equipped with a video camera and a silicon acquisŝƟŽŶ PC. The main object of the present ŝŶǀĞŶƟŽŶ is an analyƟĐĂů procedure that allows the PC to process the image collected with extreme rapidity. Advantages and ApplicaƟons The advantages of a fully 3D reconstrucƟŽn of the distribuƟŽn of inclusions in a matrix are obvious, such as the ability to grasp the existence of ordered structures (see Įgure). The system works perfectly in the case of tellurium inclusions in crystals of CdTe/CdZnTe, but it works in case of any opaque inclusions in a transparent matrix. It can also be used to study surface morphology and to determine surface roughness. Development stage A fully funĐƟonal prototype of the invenƟon is in use in IMEM-CNR laboratories. Procedures for faster analysis or for the study of surfaces, and in ƉĂƌƟĐƵlar for the analysis of surface roughness, have been developing. 25