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impaginato corretto fullone_Layout 1 13/10/15 12.08 Pagina 33 Department of Engineering, ICT and Technologies for Energy and Transport Patent Title Title Procedure and system for the three-dimensional Procedure and system for the three dimensional reconstruction of formations dispersed in a matrix reconstruction of formations dispersed in a matrix material, in particular inclusions in crystalline material, in particular inclusions in crystalline matrices. matrices. Ref. CNR 10177 Ref. CNR 10177 Assignee(s): CNR CNR Institute: IMEM Main Inventor: Andrea Zappettini Countries: IT Priority date: 05/09/2012 Abstract Abstract The presence of inclusions in the matrix CdTe / CdZnTe is an important aspect of the characterization, The presence of inclusions in the matrix CdTe / CdZnTe is an important aspect of the characterization, because these are detrimental to X-ray detector applications. The standard methods for the detection of because these are detrimental to X ray detector applications. The standard methods for the detection of inclusions do not allow a 3D reconstruction of the position of the inclusions in the crystalline matrix. For inclusions do not allow a 3D reconstruction of the position of the inclusions in the crystalline matrix. For this reason, a technique was developed for the analysis of images collected by an optical microscope this reason, a technique was developed for the analysis of images collected by an optical microscope which allows to identify the inclusions, to count the inclusion number in the whole volume of the which allows to identify the inclusions, to count the inclusion number in the whole volume of the sample, to determine the inclusion size and to determine the inclusion disribution in 3D. This technique sample, to determine the inclusion size and to determine the inclusion disribution in 3D. This technique can be implemented on any existing optical microscope, using standard personal computers for data can be implemented on any existing optical microscope, using standard personal computers for data processing and exploiting open source software. The technique can also be used for surface processing and exploiting open source software. The technique can also be used for surface reconstruction imaging and surface roughness measurements. reconstruction imaging and surface roughness measurements. Background Background Nowadays the commercial microscopy systems allow counting inclusions in a transparent matrix using the Nowadays the commercial microscopy systems allow counting inclusions in a transparent matrix using the technique so called "extended focus". However, this technique does not allow to determine the in depth technique so called "extended focus". However, this technique does not allow to determine the in depth position of the inclusions and therefore gives no information on their actual distribution in 3D. In addition, position of the inclusions and therefore gives no information on their actual distribution in 3D. In addition, the count is an underestimate, because in the case of stacked inclusions, only the first one is counted. the count is an underestimate, because in the case of stacked inclusions, only the first one is counted. Technology Technology The reconstruction system was developed on a standard optical microscope in transmission and was The reconstruction system was developed on a standard optical microscope in transmission and was equipped with a video camera and a silicon acquisition PC. The main object of the present invention is an equipped with a video camera and a silicon acquisition PC. The main object of the present invention is an analytical procedure that allows the PC to process the image collected with extreme rapidity. analytical procedure that allows the PC to process the image collected with extreme rapidity. Advantages and Applicatons Advantages and Applications The advantages of a fully 3D reconstruction of the distribution of inclusions in a matrix are obvious, such as The advantages of a fully 3D reconstruction of the distribution of inclusions in a matrix are obvious, such as the ability to grasp the existence of ordered structures (see figure). The system works perfectly in the case of the ability to grasp the existence of ordered structures (see figure). The system works perfectly in the case of tellurium inclusions in crystals of CdTe/CdZnTe, but it works in case of any opaque inclusions in a transparent tellurium inclusions in crystals of CdTe/CdZnTe, but it works in case of any opaque inclusions in a transparent matrix. It can also be used to study surface morphology and to determine surface roughness. matrix. It can also be used to study surface morphology and to determine surface roughness. Development stage Development stage A fully functional prototype of the invention is in use in IMEM-CNR laboratories. Procedures for faster A fully functional prototype of the invention is in use in IMEM CNR laboratories. Procedures for faster analysis or for the study of surfaces, and in particular for the analysis of surface roughness, have been analysis or for the study of surfaces, and in particular for the analysis of surface roughness, have been developing. developing. 33